Yoshio Tanaka
Corporate Officer/Principal at Luminescent Technologies, Inc.
Profile
Yoshio Tanaka is currently the Vice President-Japan at Luminescent Technologies, Inc. He previously worked as the Director-DFM Marketing at Synopsys, Inc., Director & General Manager at KLA Corp., Vice President-Marketing & Business Development at Numerical Technologies, Inc., and General Manager-Photomask Engineering at Oki Electric Industry Co., Ltd.
Yoshio Tanaka active positions
Companies | Position | Start |
---|---|---|
Luminescent Technologies, Inc.
Luminescent Technologies, Inc. Electronic Equipment/InstrumentsElectronic Technology Luminescent Technologies, Inc. provides computational metrology and inspection solutions to the semiconductor industry. Its computational metrology and inspection is a set of mathematical approaches designed to improve the resolution, throughput, and accuracy of defect inspection, review and repair in mask shops and wafer fabs. The firm's products include computational lithography and defect management and luminescent automated image processing hub. The company was founded by Daniel S. Abrams, Jack J. S. Herrick, Stanley Osher and Eli Yablonovitch in 2002 and is headquartered in Palo Alto, CA. | Corporate Officer/Principal | 2012-12-20 |
Former positions of Yoshio Tanaka
Companies | Position | End |
---|---|---|
OKI ELECTRIC INDUSTRY CO., LTD. | Corporate Officer/Principal | - |
Numerical Technologies, Inc. | Sales & Marketing | - |
KLA CORPORATION | Director/Board Member | - |
SYNOPSYS INC. | Sales & Marketing | - |
Experiences
Positions held
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Female
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Linked companies
Listed companies | 3 |
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SYNOPSYS INC. | Technology Services |
KLA CORPORATION | Electronic Technology |
OKI ELECTRIC INDUSTRY CO., LTD. | Electronic Technology |
Private companies | 2 |
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Luminescent Technologies, Inc.
Luminescent Technologies, Inc. Electronic Equipment/InstrumentsElectronic Technology Luminescent Technologies, Inc. provides computational metrology and inspection solutions to the semiconductor industry. Its computational metrology and inspection is a set of mathematical approaches designed to improve the resolution, throughput, and accuracy of defect inspection, review and repair in mask shops and wafer fabs. The firm's products include computational lithography and defect management and luminescent automated image processing hub. The company was founded by Daniel S. Abrams, Jack J. S. Herrick, Stanley Osher and Eli Yablonovitch in 2002 and is headquartered in Palo Alto, CA. | Electronic Technology |
Numerical Technologies, Inc. | Technology Services |
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