Steven Danyluk
Corporate Officer/Principal at Georgia Institute of Technology
Steven Danyluk active positions
| Companies | Position | Start | End |
|---|---|---|---|
| Georgia Institute of Technology | Corporate Officer/Principal | - | - |
Career history of Steven Danyluk
Former positions of Steven Danyluk
| Companies | Position | Start | End |
|---|---|---|---|
| TEXAS INSTRUMENTS INCORPORATED | Corporate Officer/Principal | 1972-12-31 | - |
| University of Illinois | Corporate Officer/Principal | - | - |
Qcept Technologies, Inc.
 Qcept Technologies, Inc. SemiconductorsElectronic Technology Qcept Technologies, Inc. provides wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Its ChemetriQ platform is adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. The company was founded by Steven Danyluk and Morris M. Bryan in 2002 and is headquartered in Atlanta, GA. | Director/Board Member | 2001-12-31 | - |
| Founder | 2001-12-31 | - |
Training of Steven Danyluk
| University of Delaware | Undergraduate Degree |
| Cornell University | Doctorate Degree |
Statistics
International
| United States | 7 |
Operational
| Corporate Officer/Principal | 3 |
| Director/Board Member | 1 |
| Founder | 1 |
Sectoral
| Consumer Services | 5 |
| Electronic Technology | 3 |
Positions held
Active
Inactive
Listed companies
Private companies
Linked companies
| Listed companies | 1 |
|---|---|
| TEXAS INSTRUMENTS INCORPORATED | Electronic Technology |
| Private companies | 1 |
|---|---|
Qcept Technologies, Inc.
Qcept Technologies, Inc. SemiconductorsElectronic Technology Qcept Technologies, Inc. provides wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Its ChemetriQ platform is adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. The company was founded by Steven Danyluk and Morris M. Bryan in 2002 and is headquartered in Atlanta, GA. | Electronic Technology |
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