PDF Solutions, Inc. Second Generation DFI System Achieves Commercial Deployment
January 16, 2019 at 12:55 am
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PDF Solutions, Inc. announced the commercial deployment of its second generation Design-for-Inspection™ solution, which includes the eProbe 250. The system is currently being prepared for shipment. Following three years of investment and development, the second generation system includes orders of magnitude advances in throughput and accuracy that now enable DFI™ on-chip instruments to be used for inline control for leading-edge semiconductor process nodes.
PDF Solutions, Inc. is a provider of comprehensive data solutions for the semiconductor ecosystem. The Company offers products and services designed to help organizations across the semiconductor and electronics ecosystems to connect, collect, manage, and analyze data about design, equipment, manufacturing, and test to improve the yield and quality of their products. Its offerings combine proprietary software, professional services and third-party cloud-hosting platforms for software-as-a-service, electrical measurement hardware tools and physical intellectual property for integrated circuit designs. The Company's products, services and solutions have been sold to integrated device manufacturers, fabless semiconductor companies, foundries, capital equipment manufacturers and system houses. The primary software products and software and hardware systems of its platform include Exensio Software, Design-for-Inspection System, Characterization Vehicle System and Cimetrix Software Products.