Mycronic AB (publ) has received the first order for an MMX metrology system from a new semiconductor customer in Asia. The order value is in the range of USD 2-4 million. Delivery of the system is planned for the third quarter of 2024.

The MMX is a new system for measuring the position of the written pattern, thereby ensuring the quality of the produced photomask. The product is based on the SLX mask writer platform and Mycronic?s existing Prexision-MMS metrology system for display photomasks. In addition, the MMX is equipped with state-of-the-art optics and software, including a modern user interface and analysis tools.

The MMX targets mature semiconductor nodes, enabling optimal flexibility for replacement of old legacy systems and future volume growth.