Aehr Test Systems announced it has received $12.7 million in orders from one of its silicon carbide test and burn-in customers for multiple sets of WaferPak? full wafer Contactors to be used for production needs for wafer level burn-in and screening of silicon carbide power semiconductors for the electric vehicle market. These WaferPaks are expected to be delivered over the next three months.

FOX WaferPak Contactors are used in conjunction with the company's FOX-NP and FOX-XP wafer level test and burn-in systems to contact 100% of the die on a wafer up to several thousand devices at a time. These proprietary WaferPak designs are specific to a customer's application as well as die layout and unique electrical contact pads. Aehr's FOX systems and WaferPaks are currently being used on wafer sizes ranging from 4", 6", 8" and 12" wafers and can be configured for a wide range of device applications.

The FOX-XP and FOX-NP systems and proprietary WaferPaks are capable of functional test and burn-in/cycling of silicon carbide and gallium nitride power semiconductors, silicon photonics integrated circuits as well as other optical devices, 2D and 3D sensors, flash memories, magnetic sensors, microcontrollers, and other leading-edge ICs in either wafer form factor before they are assembled into single or multi-die stacked packages, or in singulated die or module form factor.